Charge fluctuation induced dephasing in a gated mesoscopic interferometer

Details Charge fluctuation induced dephasing in a gated mesoscopic interferometer Charge fluctuation induced dephasing in a gated mesoscopic interferometer

2001-06-06

arxiv.org/abs/cond-mat/0106100v1

Phys. Rev. B 64, 245313 (2001).

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

13 pages, 5 figures

Scientific paper

10.1103/PhysRevB.64.245313

The reduction of the amplitude of Aharonov-Bohm oscillations in a ballistic one-channel mesoscopic interferometer due to charge fluctuations is investigated. In the arrangement considered the interferometer has four terminals and is coupled to macroscopic metallic side-gates. The Aharonov-Bohm oscillation amplitude is calculated as a function of temperature and the strength of coupling between the ring and the side-gates. The resulting dephasing rate is linear in temperature in agreement with recent experiments. Our derivation emphasizes the relationship between dephasing, ac-transport and charge fluctuations.

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