Characterization of high-quality MgB2(0001) epitaxial films on Mg(0001)

Details Characterization of high-quality MgB2(0001) epitaxial films on Mg(0001) Characterization of high-quality MgB2(0001) epitaxial films on Mg(0001)

2005-09-07

arxiv.org/abs/cond-mat/0509181v1

Physics

Condensed Matter

Materials Science

15 text pages, 6 figures Submitted for publication

Scientific paper

10.1088/1367-2630/8/1/012

High-grade MgB2(0001) films were grown on Mg(0001) by means of ultra-high-vacuum molecular beam epitaxy. Low energy electron diffraction and x-ray diffraction data indicate that thick films are formed by epitaxially oriented grains with MgB2 bulk structure. The quality of the films allowed angle-resolved photoemission and polarization dependent x-ray absorption measurements. For the first time, we report the band mapping along the Gamma-A direction and the estimation of the electron-phonon coupling constant l ~ 0.55 for the surface state electrons.

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