Capacitively Enhanced Thermal Escape in Underdamped Josephson Junctions

Details Capacitively Enhanced Thermal Escape in Underdamped Josephson Junctions Capacitively Enhanced Thermal Escape in Underdamped Josephson Junctions

2010-12-02

arxiv.org/abs/1012.0541v2

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

4 pages, 3 figures

Scientific paper

We have studied experimentally the escape dynamics in underdamped capacitively shunted and unshunted Josephson junctions with submicroampere critical currents below 0.5 K temperatures. In the shunted junctions, thermal activation process was preserved up to the highest temperature where the escape in the unshunted junctions exhibits the phase diffusion. Our observations in the shunted junctions are in good agreement with the standard thermal activation escape, unlike the results in the unshunted junctions.

Affiliated with

Also associated with

No associations

Rating

Capacitively Enhanced Thermal Escape in Underdamped Josephson Junctions does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Capacitively Enhanced Thermal Escape in Underdamped Josephson Junctions, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Capacitively Enhanced Thermal Escape in Underdamped Josephson Junctions will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-604789