Capacitance-voltage profiling techniques for characterization of semiconductor materials and devices

Details Capacitance-voltage profiling techniques for characterization of semiconductor materials and devices Capacitance-voltage profiling techniques for characterization of semiconductor materials and devices

2010-11-15

arxiv.org/abs/1011.3463v1

Physics

Condensed Matter

Materials Science

13 pages, 7 figures

Scientific paper

This work re-defines the well-known C/V (capacitance-voltage) measurement
technique, in the view of a new physics formula, discovered in 2006 by the same
author.

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