Biased Structural Fluctuations due to Electron Wind Force

Details Biased Structural Fluctuations due to Electron Wind Force Biased Structural Fluctuations due to Electron Wind Force

2007-04-14

arxiv.org/abs/0704.1852v1

Physics

Condensed Matter

Materials Science

15 pages

Scientific paper

Direct correlation between temporal structural fluctuations and electron wind force is demonstrated, for the first time, by STM imaging and analysis of atomically-resolved motion on a thin film surface under large applied current (10e5 Amp/sqare cm). The magnitude of the momentum transfer between current carriers and atoms in the fluctuating structure is at least five to fifteen times (plus or minus one sigma range) larger than for freely diffusing adatoms. The corresponding changes in surface resistivity will contribute significant fluctuation signature to nanoscale electronic properties.

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