Ballistic emission spectroscopy and imaging of a buried metal-organic interface

Details Ballistic emission spectroscopy and imaging of a buried metal-organic interface Ballistic emission spectroscopy and imaging of a buried metal-organic interface

2005-01-04

arxiv.org/abs/cond-mat/0501038v1

Physics

Condensed Matter

Materials Science

To appear in Applied Physics Letters

Scientific paper

10.1063/1.1862789

The silver-p-phenylene (Ag-PPP) interface is investigated using ballistic electron emission microscopy (BEEM). Multiple injection barriers and spatial nonuniformity of carrier injection over nanometer length scales are observed. No unique injection barrier is found. Physical reasons for these features are discussed. BEEM current images and the surface topography of the silver film are uncorrelated.

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