Ballistic Electron Emission Microscopy on CoSi${}_2$/Si(111) interfaces: band structure induced atomic-scale resolution and role of localized surface states

Physics – Condensed Matter – Materials Science

Scientific paper

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5 pages, RevTex, 4 postscript figures, http://www.icmm.csic.es/Pandres/pedro.htm

Scientific paper

10.1103/PhysRevLett.81.4963

Applying a Keldysh Green`s function method it is shown that hot electrons injected from a STM-tip into a CoSi${}_2$/Si(111) system form a highly focused beam due to the silicide band structure. This explains the atomic resolution obtained in recent Ballistic Electron Emission Microscopy (BEEM) experiments. Localized surface states in the $(2 \times 1)$-reconstruction are found to be responsible for the also reported anticorrugation of the BEEM current. These results clearly demonstrate the importance of bulk and surface band structure effects for a detailed understanding of BEEM data.

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