Avalanche photodiode array sensor with high-speed CCD delay line readout

Details Avalanche photodiode array sensor with high-speed CCD delay line readout Avalanche photodiode array sensor with high-speed CCD delay line readout

Oct 1999

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1999spie.3794..143a&link_type=abstract

Proc. SPIE Vol. 3794, p. 143-147, Materials and Electronics for High-Speed and Infrared Detectors, Stephen M. Goodnick; Walter F

Physics

Scientific paper

A prototype solid-state multi-chip-module (MCM) optical sensor circuit is described. The MCM is designed to sample the optical signals from a fiber-optic array at rates up to 200 MHz. The fiber-optic inputs interface to the MCM avalanche-photodiode (APD) sensor array. The prototype 40 pixel MCM stores approximately 1000 samples from each fiber before readout. This is done on the MCM using high-speed charge-injection input CCD delay line ICs. The MCM is designed to be cooled to 0 degrees C. This stabilizes the APD gain and minimizes dark current generation in the APD and the CCD delay line.

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