Physics – Condensed Matter – Materials Science
Scientific paper
2004-07-12
Thin Solid Films 473/2 (2005) 272-277
Physics
Condensed Matter
Materials Science
Scientific paper
10.1016/j.tsf.2004.08.017
We have developed a wedge-loaded double-cantilever beam adhesion measurement set-up for thin films deposited on glass by sputtering. The test is described in details. Results on the Glass/sublayer/Ag/ZnO multilayer provide evidence that \SnOd or \TiOd perform better than ZnO as a sublayer. Then however, rupture within the multilayer shifts to the upper Ag/ZnO interface. The latter is shown to be tougher than the lower ZnO/Ag interface, an asymmetry due to non-equilibrium interfacial structures.
Barthel Etienne
Kerjan Olivier
Nadaud Nicolas
Nael Pascal
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