Physics – Condensed Matter – Statistical Mechanics
Scientific paper
2004-06-24
PHYSICAL REVIEW B 70, 224206 (2004)
Physics
Condensed Matter
Statistical Mechanics
8 pages, 9 figures; to be submitted to Phys. Rev. B; updated references, expanded discussion
Scientific paper
10.1103/PhysRevB.70.224206
X-ray reflectivity measurements on the free surface of liquid Sn are presented. They exhibit the high-angle peak, indicative of surface-induced layering, also found for other pure liquid metals (Hg, Ga and In). However, a low-angle peak, not hitherto observed for any pure liquid metal, is also found, indicating the presence of a high-density surface layer. Fluorescence and resonant reflectivity measurements rule out the assignment of this layer to surface-segregation of impurities. The reflectivity is modelled well by a 10% contraction of the spacing between the first and second atomic surface layers, relative to that of subsequent layers. Possible reasons for this are discussed.
Deutsch Moshe
Gebhardt Jeff
Graber Tim
Grigoriev Alexei Yu.
Lin Binhua
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