Analytical characterization of adhering vesicles

Details Analytical characterization of adhering vesicles Analytical characterization of adhering vesicles

2001-12-13

arxiv.org/abs/cond-mat/0112247v1

Physics

Condensed Matter

Soft Condensed Matter

10 pages, 10 figures

Scientific paper

10.1103/PhysRevE.65.041912

We characterize vesicle adhesion onto homogeneous substrates by means of a perturbative expansion around the infinite adhesion limit, where curvature elasticity effects are absent. At first order in curvature elasticity, we determine analytically various global physical quantities associated with adhering vesicles: height, adhesion radius, etc. Our results are valid for adhesion energies above a certain threshold, that we determine numerically. We discuss the haptotactic force acting on a vesicle in the limit of weak adhesion gradients. We also propose novel methods for measuring adhesion energies and we suggest a possible way of determining the size of suboptical vesicles using controlled adhesion gradients.

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