Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

Details Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

2009-10-28

arxiv.org/abs/0910.5491v2

New Journal of Physics 12 (2010) 035013

Physics

Condensed Matter

Materials Science

18 pages, 6 figures Submitted to New Journal of Physics

Scientific paper

10.1088/1367-2630/12/3/035013

Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this article we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. The article also discusses the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.

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