Analysis of Shot Noise at Finite Temperatures in Fractional Quantum Hall Edge States

Details Analysis of Shot Noise at Finite Temperatures in Fractional Quantum Hall Edge States Analysis of Shot Noise at Finite Temperatures in Fractional Quantum Hall Edge States

2011-01-25

arxiv.org/abs/1101.4709v2

J. Phys. Soc. Jpn. 80 (2011) 073709

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

5 pages, 3 figures

Scientific paper

10.1143/JPSJ.80.073709

We investigate shot noise at {\it finite temperatures} induced by the quasi-particle tunneling between fractional quantum Hall (FQH) edge states. The resulting Fano factor has the peak structure at a certain bias voltage. Such a structure indicates that quasi-particles are weakly {\it glued} due to thermal fluctuation. We show that the effect makes it possible to probe the difference of statistics between $\nu=1/5,{}2/5$ FQH states where quasi-particles have the same unit charge.Finally we propose a way to indirectly obtain statistical angle in hierarchical FQH states.

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