AFM's path to atomic resolution

Details AFM's path to atomic resolution AFM's path to atomic resolution

2005-03-29

arxiv.org/abs/cond-mat/0503671v1

Materials Today 8 (5), 32-41(2005)

Physics

Condensed Matter

Materials Science

Submitted to Materials Today, scheduled for May 2005 issue

Scientific paper

10.1016/S1369-7021(05)00844-8

We review the progress in the spatial resolution of atomic force microscopy (AFM) in vacuum. After an introduction of the basic principle and a conceptual comparison to scanning tunneling microscopy, the main challenges of AFM and the solutions that have evolved in the first twenty years of its existence are outlined. Some crucial steps along the AFM's path towards higher resolution are discussed, followed by an outlook on current and future applications.

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