Advances in atomic force microscopy

Details Advances in atomic force microscopy Advances in atomic force microscopy

2003-05-06

arxiv.org/abs/cond-mat/0305119v1

Reviews of Modern Physics 75 (3), 949-983 2003

Physics

Condensed Matter

Materials Science

In press (Reviews of Modern Physics, scheduled for July 2003), 86 pages, 44 figures

Scientific paper

10.1103/RevModPhys.75.949

This article reviews the progress of atomic force microscopy (AFM) in ultra-high vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows to image surfaces of conductors \emph{and} insulators in vacuum with atomic resolution. The mostly used technique for atomic resolution AFM in vacuum is frequency modulation AFM (FM-AFM). This technique, as well as other dynamic AFM methods, are explained in detail in this article. In the last few years many groups have expanded the empirical knowledge and deepened the theoretical understanding of FM-AFM. Consequently, the spatial resolution and ease of use have been increased dramatically. Vacuum AFM opens up new classes of experiments, ranging from imaging of insulators with true atomic resolution to the measurement of forces between individual atoms.

Affiliated with

Also associated with

No associations

Rating

Advances in atomic force microscopy does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Advances in atomic force microscopy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Advances in atomic force microscopy will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-596185