Advancement of a Compact Reflectron TOF-MS for Planetary Sample Analysis

Details Advancement of a Compact Reflectron TOF-MS for Planetary Sample Analysis Advancement of a Compact Reflectron TOF-MS for Planetary Sample Analysis

Mar 2010

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2010lpi....41.2358b&link_type=abstract

41st Lunar and Planetary Science Conference, held March 1-5, 2010 in The Woodlands, Texas. LPI Contribution No. 1533, p.2358

Physics

1

Scientific paper

We present the status of our development of a miniature mass
spectrometer for in situ planetary exploration. The spectrometer uses
pulsed laser desorption and an advanced reflectron time-of-flight mass
analyzer to detect elements and organics in solid samples.

Affiliated with

Also associated with

No associations

Rating

Advancement of a Compact Reflectron TOF-MS for Planetary Sample Analysis does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Advancement of a Compact Reflectron TOF-MS for Planetary Sample Analysis, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Advancement of a Compact Reflectron TOF-MS for Planetary Sample Analysis will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-1209273