A system for measuring auto- and cross-correlation of current noise at low temperatures

Details A system for measuring auto- and cross-correlation of current noise at low temperatures A system for measuring auto- and cross-correlation of current noise at low temperatures

2006-04-02

arxiv.org/abs/cond-mat/0604018v2

Rev. Sci. Instru. 77, 073906 (2006).

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

related papers at http://marcuslab.harvard.edu

Scientific paper

10.1063/1.2221541

We describe the construction and operation of a two-channel noise detection system for measuring power and cross spectral densities of current fluctuations near 2 MHz in electronic devices at low temperatures. The system employs cryogenic amplification and fast-Fourier-transform based spectral measurement. The gain and electron temperature are calibrated using Johnson noise thermometry. Full shot noise of 100 pA can be resolved with an integration time of 10 s. We report a demonstration measurement of bias-dependent current noise in a gate defined GaAs/AlGaAs quantum point contact.

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