A Study of Temperature-dependent Properties of N-type delta-doped Si Band-structures in Equilibrium

Physics – Condensed Matter – Materials Science

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

IEEE proceedings of the 13th International Workshop on Computational Electronics (IWCE-13)

Scientific paper

A highly phosphrous delta-doped Si device is modeled with a quantum well with periodic boundary conditions and the semi-empirical spds* tight-binding band model. Its temperature-dependent electronic properties are studied. To account for high doping density with many electrons, a highly parallelized self-consistent Schroedinger-Poisson solver is used with atomistic representations of multiple impurity ions. The band-structure in equilibrium and the corresponding Fermi-level position are computed for a selective set of temperatures. The result at room temperature is compared with previous studies and the temperature-dependent electronic properties are discussed further in detail with the calculated 3-D self-consistent potential profile.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

A Study of Temperature-dependent Properties of N-type delta-doped Si Band-structures in Equilibrium does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with A Study of Temperature-dependent Properties of N-type delta-doped Si Band-structures in Equilibrium, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and A Study of Temperature-dependent Properties of N-type delta-doped Si Band-structures in Equilibrium will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-556559

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.