A Structural Probe of the Doped Holes in Cuprate Superconductors

Details A Structural Probe of the Doped Holes in Cuprate Superconductors A Structural Probe of the Doped Holes in Cuprate Superconductors

2002-08-14

arxiv.org/abs/cond-mat/0208289v1

Science, vol. 297, p. 581 (26 July 2002)

Physics

Condensed Matter

Superconductivity

Scientific paper

10.1126/science.1070903

An unresolved issue concerning cuprate superconductors is whether the distribution of carriers in the CuO(2) plane is uniform or inhomogeneous. Because the carriers comprise a small fraction of the total charge density and may be rapidly fluctuating, modulations are difficult to detect directly. Here we demonstrate that in anomalous x-ray scattering at the oxygen K edge of the cuprates, the contribution of carriers to the scattering amplitude is selectively magnified 82 times. This enhances diffraction from the doped holes by more than 10^3, permitting direct structural analysis of the superconducting ground state. Scattering from thin films of La(2)CuO(4+x) (Tc = 39 K) at T=(50 +/- 5) K on the reciprocal space intervals (0,0,0.21) -> (0,0,1.21) and (0,0,0.6) -> (0.3,0,0.6) show a rounding of the carrier density near the substrate suggestive of a depletion zone or similar effect. The structure factor for off-specular scattering was less than 3x10-7 e, suggesting an absence of in-plane hole ordering in this material.

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