A Scanning Electron Microscope for Ultracold Atoms

Details A Scanning Electron Microscope for Ultracold Atoms A Scanning Electron Microscope for Ultracold Atoms

2006-07-14

arxiv.org/abs/cond-mat/0607358v1

Laser Phys. Lett. 3, 415-419 (2006)

Physics

Condensed Matter

Statistical Mechanics

5 pages, 2 figures

Scientific paper

10.1002/lapl.200610028

We propose a new technique for the detection of single atoms in ultracold quantum gases. The technique is based on scanning electron microscopy and employs the electron impact ionization of trapped atoms with a focussed electron probe. Subsequent detection of the resulting ions allows for the reconstruction of the atoms position. This technique is expected to achieve a much better spatial resolution compared to any optical detection method. In combination with the sensitivity to single atoms, it makes new in situ measurements of atomic correlations possible. The detection principle is also well suited for the addressing of individual sites in optical lattices.

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