Physics – Condensed Matter – Materials Science
Scientific paper
2003-05-12
Physics
Condensed Matter
Materials Science
Paper submitted to International Conference on Magnetism (Rome 2003)
Scientific paper
10.1016/j.jmmm.2003.12.1372
A novel broad-band measurement method of the MI in thin films and ribbons is
presented. It is based on the automated measurement of the reflection
coefficient of a cell loaded with the sample. Illustrative results obtained
with a permalloy multilayer thin film are presented and discussed.
Fessant A.
Gieraltowski J.
Tannous C.
Valenzuela R.
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