A Novel Broadband Measurement Method for the Magnetoimpedance of Ribbons and Thin Films

Physics – Condensed Matter – Materials Science

Scientific paper

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Paper submitted to International Conference on Magnetism (Rome 2003)

Scientific paper

10.1016/j.jmmm.2003.12.1372

A novel broad-band measurement method of the MI in thin films and ribbons is
presented. It is based on the automated measurement of the reflection
coefficient of a cell loaded with the sample. Illustrative results obtained
with a permalloy multilayer thin film are presented and discussed.

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