A model of transport nonuniversality in thick-film resistors

Details A model of transport nonuniversality in thick-film resistors A model of transport nonuniversality in thick-film resistors

2003-07-07

arxiv.org/abs/cond-mat/0307141v1

Appl. Phys. Lett. vol.83, pag.189 (7 July 2003)

Physics

Condensed Matter

Disordered Systems and Neural Networks

3 pages, 1 figure

Scientific paper

10.1063/1.1590733

We propose a model of transport in thick-film resistors which naturally explains the observed nonuniversal values of the conductance exponent t extracted in the vicinity of the percolation transition. Essential ingredients of the model are the segregated microstructure typical of thick-film resistors and tunneling between the conducting grains. Nonuniversality sets in as consequence of wide distribution of interparticle tunneling distances.

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