A Millikelvin Scanned Probe for Measurement of Nanostructures

Details A Millikelvin Scanned Probe for Measurement of Nanostructures A Millikelvin Scanned Probe for Measurement of Nanostructures

2003-11-10

arxiv.org/abs/cond-mat/0311224v1

Rev. Sci. Instrum. 75, 2029 (2004)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

5 pages, 5 figures, submitted to RSI

Scientific paper

10.1063/1.1753104

We demonstrate a scanning force microscope, based upon a quartz tuning fork, that operates below 100 mK and in magnetic fields up to 6 T. The microscope has a conducting tip for electrical probing of nanostructures of interest, and it incorporates a low noise cryogenic amplifier to measure both the vibrations of the tuning fork and the electrical signals from the nanostructures. At millikelvin temperatures the imaging resolution is below 1 um in a 22 um x 22 um range, and a coarse motion provides translations of a few mm. This scanned probe is useful for high bandwidth measurement of many high impedance nanostructures on a single sample. We show data locating an SET within an array and measure its coulomb blockade with a sensitivity of 2.6 x 10^-5 e/Hz^1/2.

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