A methodology to assess and select a suitable reliability prediction method for EEE components in space applications

Details A methodology to assess and select a suitable reliability prediction method for EEE components in space applications A methodology to assess and select a suitable reliability prediction method for EEE components in space applications

Dec 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002esasp.507...73g&link_type=abstract

Proceedings of the European Space Components Conference, ESCCON 2002, 24-27 September 2002, Toulouse, France. Compiled by R.A. H

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The rapid development of electronic components in recent times has left the standard reliability prediction methodologies behind, with a lack of models and data for some of the more modern component types. Also due to changes in the way reliability is achieved, less accent has been placed on predictions and this has led in turn to the discontinuity of updates for a number of prediction handbooks. Besides this, general budgetary restrictions hampered failure rate data maintenance. However, in some market sectors, such as space industry or telecommunication industry, the necessity to predict reliability still exists. The ECSS Q-60-15 working group has developed a set of criteria that will allow users to assess, and choose, between the available EEE parts reliability prediction methodologies and data sources for use in space applications. Where a standard prediction method is unsuitable, use of manufacturers data is elaborated . This paper describes the philosophy of such an approach and provides some guidance of its application to choose prediction systems for a number of modern components.

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