Reliability prediction for microcontrollers with embedded EEPROM

Details Reliability prediction for microcontrollers with embedded EEPROM Reliability prediction for microcontrollers with embedded EEPROM

Dec 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002esasp.507...67l&link_type=abstract

Proceedings of the European Space Components Conference, ESCCON 2002, 24-27 September 2002, Toulouse, France. Compiled by R.A. H

Computer Science

Scientific paper

A reliability prediction case is proposed that highlights the influence of an EEPROM embedded block in a C51 Microcontroller. It appears that reliability prediction depends mostly on the die size and the technology complexity. Data Retention and Cycling Endurance, which are specific life duration limitations inherent to the EEPROM technology, have a minor impact on the overall reliability calculation. Prediction models result of experiments carried out at product level in test conditions accelerated by temperature. Activation Energies for both Endurance and Data- retention have been extracted enabling a comparison with Dynamic Life Test, and Climatic Tests failure rate. The comparison is presented for several usual mission profiles, but space environment effects, especially radiations, have not been considered in this study.

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