A low-temperature dynamic mode scanning force microscope operating in high magnetic fields

Details A low-temperature dynamic mode scanning force microscope operating in high magnetic fields A low-temperature dynamic mode scanning force microscope operating in high magnetic fields

1999-01-05

arxiv.org/abs/cond-mat/9901023v1

Rev. Sci. Instr. 70, 2765 (1999)

Physics

Condensed Matter

5 pages, 5 figures, submitted to "Review of Scientific Instruments"

Scientific paper

10.1063/1.1149842

A scanning force microscope was implemented operating at temperatures below 4.2K and in magnetic fields up to 8T. Piezoelectric quartz tuning forks were employed for non optical tip-sample distance control in the dynamic operation mode. Fast response was achieved by using a phase-locked loop for driving the mechanical oscillator. Possible applications of this setup for various scanning probe techniques are discussed.

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