A k-space transport analysis of the BEEM spectroscopy of Au/Si Schottky barriers

Details A k-space transport analysis of the BEEM spectroscopy of Au/Si Schottky barriers A k-space transport analysis of the BEEM spectroscopy of Au/Si Schottky barriers

1997-10-15

arxiv.org/abs/cond-mat/9710147v1

Physics

Condensed Matter

Materials Science

7 pages, Latex-APS, 2 postscript figures, http://www.icmm.csic.es/Pandres/pedro.htm, Proc. 10th Conf. on Microscopy of Sem.

Scientific paper

We address the question of the spatial resolution of ballistic electron emission microscopy (BEEM) of Shottky barriers in Au(111)/Si(100) and Au(111)/Si(111) interfaces. A novel combination of Green-function and k-space Ensemble-Monte-Carlo techniques is used to obtain new insights into the spatial and energetic evolution of the STM-tip-induced electrons during their passage through the metallic layer before reaching the metal-semiconductor interface. In particular, it is shown how the effect of band-structure-induced directional focusing of the electrons enforces a reinterpretation of existing experimental data.

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