A Hybrid model for the origin of photoluminescence from Ge nanocrystals in SiO$_2$ matrix

Details A Hybrid model for the origin of photoluminescence from Ge nanocrystals in SiO$_2$ matrix A Hybrid model for the origin of photoluminescence from Ge nanocrystals in SiO$_2$ matrix

2006-07-28

arxiv.org/abs/cond-mat/0607748v1

Physics

Condensed Matter

Materials Science

23 pages, 8 figures

Scientific paper

10.1088/0268-1242/21/12/032

In spite of several articles, the origin of visible luminescence from germanium nanocrystals in SiO$_2$ matrix is controversial even today. Some authors attribute the luminescence to quantum confinement of charge carriers in these nanocrystals. On the other hand, surface or defect states formed during the growth process, have also been proposed as the source of luminescence in this system. We have addressed this long standing query by simultaneous photoluminescence and Raman measurements on germanium nanocrystals embedded in SiO$_2$ matrix, grown by two different techniques: (i) low energy ion-implantation and (ii) atom beam sputtering. Along with our own experimental observations, we have summarized relevant information available in the literature and proposed a \emph{Hybrid Model} to explain the visible photoluminescence from nanocrystalline germanium in SiO$_2$ matrix.

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