A generic x-ray tracing toolbox in Geant4

Details A generic x-ray tracing toolbox in Geant4 A generic x-ray tracing toolbox in Geant4

May 2009

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2009spie.7360e..28v&link_type=abstract

EUV and X-Ray Optics: Synergy between Laboratory and Space. Edited by Hudec, René; Pina, Ladislav. Proceedings of the SPIE, Vo

Physics

Optics

Scientific paper

We have developed a generic X-ray tracing toolbox based on Geant4, a
generic simulation toolkit. By leveraging the facilities available on
Geant4, we are able to design and analyze complex X-ray optical systems.
In this article we describe our toolbox, and describe how it is being
applied to support the development of silicon pore optics for IXO.

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