A fourfold coordinated point defect in silicon

Details A fourfold coordinated point defect in silicon A fourfold coordinated point defect in silicon

2002-01-11

arxiv.org/abs/cond-mat/0201163v1

Physics

Condensed Matter

Materials Science

Scientific paper

10.1103/PhysRevLett.88.235501

Due to their technological importance, point defects in silicon are among the best studied physical systems. The experimental examination of point defects buried in bulk is difficult and evidence for the various defects usually indirect. Simulations of defects in silicon have been performed at various levels of sophistication ranging from fast force fields to accurate density functional calculations. The generally accepted viewpoint from all these studies is that vacancies and self interstitials are the basic point defects in silicon. We challenge this point of view by presenting density functional calculations that show that there is a new fourfold coordinated point defect in silicon that is lower in energy.

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