Logarithmic corrections to scaling in critical percolation and random resistor networks

Details Logarithmic corrections to scaling in critical percolation and random resistor networks Logarithmic corrections to scaling in critical percolation and random resistor networks

2003-05-09

arxiv.org/abs/cond-mat/0305217v3

Phys. Rev. E 68, 036129 (2003)

Physics

Condensed Matter

Statistical Mechanics

14 pages, 1 figure, version to appear in Phys. Rev. E

Scientific paper

10.1103/PhysRevE.68.036129

We study the critical behavior of various geometrical and transport properties of percolation in 6 dimensions. By employing field theory and renormalization group methods we analyze fluctuation induced logarithmic corrections to scaling up to and including the next to leading correction. Our study comprehends the percolation correlation function, i.e., the probability that 2 given points are connected, and some of the fractal masses describing percolation clusters. To be specific, we calculate the mass of the backbone, the red bonds and the shortest path. Moreover, we study key transport properties of percolation as represented by the random resistor network. We investigate the average 2-point resistance as well as the entire family of multifractal moments of the current distribution.

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