Structural, electrical and magnetic properties of Mo1-xFexO2 (x=0-0.05) thin films grown by pulsed laser ablation

Details Structural, electrical and magnetic properties of Mo1-xFexO2 (x=0-0.05) thin films grown by pulsed laser ablation Structural, electrical and magnetic properties of Mo1-xFexO2 (x=0-0.05) thin films grown by pulsed laser ablation

2009-12-05

arxiv.org/abs/0912.0978v1

J. Appl. Phys. 103, 043712 (2008)

Physics

Condensed Matter

Materials Science

18 pages, 8 figurs and 2 tables

Scientific paper

10.1063/1.2885143

We report the growth of undoped and Fe (2 and 5 at. percentage) doped molybdenum oxide thin films on c-plane of sapphire substrate using pulsed laser ablation. X-ray diffraction results show that the films are oriented in (100) direction and have monoclinic structure based on MoO2 phase as also supported by Raman spectroscopy. The x-ray photoelectron spectroscopy reveals chemical state of Fe is +2, which favors the substitutional occupancy of Fe ion in the MoO2 matrix. The room temperature resistivity of all the films are very low (approx.100 microohm-cm). The Fe doped samples show ferromagnetic behavior at room temperature.

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