Thickness-Dependence of the Coercive Field in Ferroelectrics

Details Thickness-Dependence of the Coercive Field in Ferroelectrics Thickness-Dependence of the Coercive Field in Ferroelectrics

2002-06-03

arxiv.org/abs/cond-mat/0206014v1

Physics

Condensed Matter

Materials Science

Scientific paper

For forty years researchers on ferroelectric switching have used the Kay-Dunn theory to model the thickness-dependence of the coercive field; it works surprisingly well, despite the fact that it is based upon homogeneous nucleation and a small-field expansion, neither of which is realized in thin films. Here we demonstrate that this result can be obtained from a more general Kolmogorov-Avrami model of (inhomogeneous) nucleation and growth. By including a correction to the switching field across the dielectric that includes Thomas-Fermi screening in the metal electrode, we show that our theory quantitatively describes the coercive fields versus thickness in several different families of ferroelectric (lead zirconate-titanate [PZT], potassium nitrate, and polyvinylidenefluoride [PVDF]) over a wide range of thickness (5 decades). This agreement is particularly satisfying in the case of PVDF, as it indicates that the switching kinetics are domain-wall limited down to 1 nanometer and thus require no new effects.

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