Frequency-Dependent Shot Noise as a Probe of Electron-Electron Interaction in Mesoscopic Diffusive Contacts

Details Frequency-Dependent Shot Noise as a Probe of Electron-Electron Interaction in Mesoscopic Diffusive Contacts Frequency-Dependent Shot Noise as a Probe of Electron-Electron Interaction in Mesoscopic Diffusive Contacts

1998-06-24

arxiv.org/abs/cond-mat/9806281v1

Phys. Rev. B58, R7512 (1998)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

3 pages, RevTeX, 3 eps figures

Scientific paper

10.1103/PhysRevB.58.R7512

The frequency-dependent shot noise in long and narrow mesoscopic diffusive contacts is numerically calculated. The case of arbitrarily strong electron-electron scattering and zero temperature of electrodes is considered. For all voltages, the noise increases with frequency and tends to finite values. These limiting values are larger than the Poissonian noise and increase nearly as voltage to power 4/3. This allows one to experimentally determine the parameters of electron-electron interaction.

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