Modelling of strain effects in manganite films

Physics – Condensed Matter – Strongly Correlated Electrons

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

7 figures. To be published on Physical Review B

Scientific paper

10.1103/PhysRevB.68.224424

Thickness dependence and strain effects in films of $La_{1-x}A_xMnO_3$ perovskites are analyzed in the colossal magnetoresistance regime. The calculations are based on a generalization of a variational approach previously proposed for the study of manganite bulk. It is found that a reduction in the thickness of the film causes a decrease of critical temperature and magnetization, and an increase of resistivity at low temperatures. The strain is introduced through the modifications of in-plane and out-of-plane electron hopping amplitudes due to substrate-induced distortions of the film unit cell. The strain effects on the transition temperature and transport properties are in good agreement with experimental data only if the dependence of the hopping matrix elements on the $Mn-O-Mn$ bond angle is properly taken into account. Finally variations of the electron-phonon coupling linked to the presence of strain turn out important in influencing the balance of coexisting phases in the film

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Modelling of strain effects in manganite films does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Modelling of strain effects in manganite films, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Modelling of strain effects in manganite films will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-635039

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.