Surface Resistance Imaging with a Scanning Near-Field Microwave Microscope

Details Surface Resistance Imaging with a Scanning Near-Field Microwave Microscope Surface Resistance Imaging with a Scanning Near-Field Microwave Microscope

1997-12-12

arxiv.org/abs/cond-mat/9712142v1

Appl. Phys. Lett., vol. 71, no. 12, p. 1736 (1997)

Physics

Condensed Matter

Materials Science

6 pages, 3 figures; for color versions of figures see www.csr.umd.edu/research/hifreq/micr_microscopy.html

Scientific paper

10.1063/1.120020

We describe near-field imaging of sample sheet resistance via frequency shifts in a resonant coaxial scanning microwave microscope. The frequency shifts are related to local sample properties, such as surface resistance and dielectric constant. We use a feedback circuit to track a given resonant frequency, allowing measurements with a sensitivity to frequency shifts as small as one parts in 50000 for a 30 ms sampling time. The frequency shifts can be converted to sheet resistance based on a simple model of the system.

Affiliated with

Also associated with

No associations

Rating

Surface Resistance Imaging with a Scanning Near-Field Microwave Microscope does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Surface Resistance Imaging with a Scanning Near-Field Microwave Microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface Resistance Imaging with a Scanning Near-Field Microwave Microscope will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-614345