Intermixing in Cu/Co: molecular dynamics simulations and Auger electron spectroscopy depth profiling

Details Intermixing in Cu/Co: molecular dynamics simulations and Auger electron spectroscopy depth profiling Intermixing in Cu/Co: molecular dynamics simulations and Auger electron spectroscopy depth profiling

2006-05-05

arxiv.org/abs/cond-mat/0605130v1

Physics

Condensed Matter

Materials Science

3 pages, 2 figures

Scientific paper

The ion-bombardment induced evolution of intermixing is studied by molecular dynamics simulations and by Auger electron spectroscopy depth profiling analysis (AESD) in Cu/Co multilayer. It has been shown that from AESD we can derive the low-energy mixing rate and which can be compared with the simulated values obtained by molecular dynamics (MD) simulations. The overall agreement is reasonably good hence MD can hopefuly be used to estimate the rate of intermixing in various interface systems.

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