Shot Noise in Linear Macroscopic Resistors

Details Shot Noise in Linear Macroscopic Resistors Shot Noise in Linear Macroscopic Resistors

2004-06-21

arxiv.org/abs/cond-mat/0406484v2

Phys. Rev. Lett., vol. 92, n. 22, 226601-1 (2004)

Physics

Condensed Matter

Materials Science

10 pages, 5 figures

Scientific paper

10.1103/PhysRevLett.92.226601

We report on a direct experimental evidence of shot noise in a linear macroscopic resistor. The origin of the shot noise comes from the fluctuation of the total number of charge carriers inside the resistor associated with their diffusive motion under the condition that the dielectric relaxation time becomes longer than the dynamic transit time. Present results show that neither potential barriers nor the absence of inelastic scattering are necessary to observe shot noise in electronic devices.

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