Contact Instability in Adhesion and Debonding of Thin Elastic Films

Details Contact Instability in Adhesion and Debonding of Thin Elastic Films Contact Instability in Adhesion and Debonding of Thin Elastic Films

2006-06-27

arxiv.org/abs/cond-mat/0606680v1

Physics

Condensed Matter

Soft Condensed Matter

Accepted for publication in Phys. Rev. Lett

Scientific paper

10.1103/PhysRevLett.97.069903

Based on experiments and 3-D simulations, we show that a soft elastic film during adhesion and debonding from a rigid flat surface undergoes morphological transitions to pillars, labyrinths and cavities, all of which have the same lateral pattern length scale, close to \lambda/H ~ 3 for thick films, H > 1 micrometer. The linear stability analysis and experiments show a new thin film regime where \lambda/H \approx 3+ 2 (\gamma/3 \mu H)^(1/4) (\gamma is surface tension, \mu is shear modulus) because of significant surface energy penalty (for example, \lambda/H = 6 for H = 200 nm; \mu = 1MPa).

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