X-ray fluorescence spectroscopy from ions at charged vapor/water interfaces

Details X-ray fluorescence spectroscopy from ions at charged vapor/water interfaces X-ray fluorescence spectroscopy from ions at charged vapor/water interfaces

2009-05-04

arxiv.org/abs/0905.0475v1

J. Appl. Phys. 105 084911 (2009)

Physics

Condensed Matter

Soft Condensed Matter

Scientific paper

10.1063/1.3117487

X-ray fluorescence spectra from monovalent ions (Cs+) that accumulate from dilute solutions to form an ion-rich layer near a charged Langmuir monolayer are presented. For the salt solution without the monolayer, the fluorescence signals below the critical angle are significantly lower than the detection sensitivity and only above the critical angle signals from the bulk are observed. In the presence of a monolayer that provides surface charges, strong fluorescence signals below the critical angle are observed. Ion density accumulated at the interface are determined from the fluorescence. The fluorescent spectra collected as a function of incident x-ray energy near the LIII edge yield the extended absorption spectra from the ions, and are compared to recent independent results. The fluorescence data from divalent Ba2+ with and without monolayer are also presented.

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