Proposal for all-electrical measurement of T_1 in semiconductors

Details Proposal for all-electrical measurement of T_1 in semiconductors Proposal for all-electrical measurement of T_1 in semiconductors

2002-05-09

arxiv.org/abs/cond-mat/0205177v1

Appl. Phys. Lett. 82, 221 (2003)

Physics

Condensed Matter

4 pages, 2 figures

Scientific paper

10.1063/1.1536270

In an inhomogeneously doped magnetic semiconductor spin relaxation time T_1 can be determined by all-electrical measurements. Nonequilibrium spin injected in a magnetic p-n junction gives rise to the spin-voltaic effect where the nonequilibrium spin-induced charge current is very sensitive to T_1 and can flow even at no applied bias. It is proposed that T_1 can be determined by measuring the I-V characteristics in such a geometry. For a magnetic p-n junction where the results can be calculated analytically, it is in addition possible to extract the g-factor and the degree of injected carrier spin polarization.

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