Delocalization of Flux Lines from Extended Defects by Bulk Randomness

Details Delocalization of Flux Lines from Extended Defects by Bulk Randomness Delocalization of Flux Lines from Extended Defects by Bulk Randomness

1993-03-09

arxiv.org/abs/cond-mat/9303015v1

Physics

Condensed Matter

5 pages, 3 figures available upon request,REVTeX 3.0

Scientific paper

10.1209/0295-5075/23/7/007

We study the delocalization by bulk randomness of a single flux line (FL) from an extended defect, such as a columnar pin or twin plane. In three dimensions, the FL is always bound to a planar defect, while there is an unpinning transition from a columnar pin. Transfer matrix simulations confirm this picture, and indicate that the divergence of the localization length from the columnar defect is governed by a liberation exponent $\nu_\perp =1.3 \pm 0.6$, for which a ``mean-field'' estimate gives $\nu_\perp \approx 0.78$. The results, and their extensions, are compared to other theories. The effects may be observable in thin samples close to $H_{c1}$.

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