Improved self-absorption correction for fluorescence measurements of extended x-ray absorption fine-structure

Details Improved self-absorption correction for fluorescence measurements of extended x-ray absorption fine-structure Improved self-absorption correction for fluorescence measurements of extended x-ray absorption fine-structure

2003-06-10

arxiv.org/abs/cond-mat/0306252v1

Physica Scripta, T115, 202 (2005)

Physics

Condensed Matter

3 pages, 3 figure (eps), submitted to The 12th International Conference on X-Ray Absorption Fine Structure (XAFS XII)

Scientific paper

Extended x-ray absorption fine-structure (EXAFS) data collected in the fluorescence mode are susceptible to an apparent amplitude reduction due to the self-absorption of the fluorescing photon by the sample before it reaches a detector. Previous treatments have made the simplifying assumption that the effect of the EXAFS on the correction term is negligible, and that the samples are in the thick limit. We present a nearly exact treatment that can be applied for any sample thickness or concentration, and retains the EXAFS oscillations in the correction term.

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