Microscopic Method for Dislocation Tracking

Details Microscopic Method for Dislocation Tracking Microscopic Method for Dislocation Tracking

2002-12-13

arxiv.org/abs/cond-mat/0212318v1

Physics

Condensed Matter

Materials Science

9 pages, 8 figures

Scientific paper

We show that a microscopic definition of crystal defect, based on the
effective mean single-particle potential energy, makes it possible to detect
and visualize various types of local and extended crystal defects and develop
an effective algorithm for tracking their time evolution.

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