Generalized four-point characterization method for resistive and capacitive contacts

Details Generalized four-point characterization method for resistive and capacitive contacts Generalized four-point characterization method for resistive and capacitive contacts

2011-08-25

arxiv.org/abs/1108.5006v1

Physics

Condensed Matter

Other Condensed Matter

21 pages, 10 figures

Scientific paper

In this paper, a four-point characterization method is developed for resistive samples connected to either resistive or capacitive contacts. Provided the circuit equivalent of the complete measurement system is known including coaxial cable and connector capacitances as well as source output and amplifier input impedances, a frequency range and capacitive scaling factor can be determined, whereby four-point characterization can be performed. The technique is demonstrated with a discrete element test sample over a wide frequency range using lock-in measurement techniques from 1 Hz - 100 kHz. The data fit well with a circuit simulation of the entire measurement system. A high impedance preamplifier input stage gives best results, since lock-in input impedances may differ from manufacturer specifications. The analysis presented here establishes the utility of capacitive contacts for four-point characterizations at low frequency.

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