Simultaneously imaging of dielectric properties and topography in a PbTiO_3 crystal by near-field scanning microwave microscopy

Details Simultaneously imaging of dielectric properties and topography in a PbTiO_3 crystal by near-field scanning microwave microscopy Simultaneously imaging of dielectric properties and topography in a PbTiO_3 crystal by near-field scanning microwave microscopy

2000-02-17

arxiv.org/abs/cond-mat/0002272v1

Physics

Condensed Matter

Materials Science

Scientific paper

10.1063/1.126611

We use a near-field scanning microwave microscope to simultaneously image the dielectric constant, loss tangent, and topography in a PbTiO_3 crystal. By this method, we study the effects of the local dielectric constant and loss tangent in the geometry of periodic domains on the measured resonant frequency, and quality factor. We also carry out theoretical calculations and the results agree well with the experimental data and reveal the anisotropic nature of dielectric constant.

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