Stability of E' centers induced by 4.7eV laser radiation in SiO2

Physics – Condensed Matter – Materials Science

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

12 pages, 3 figures, in press on J. Non cryst. solids (2007)

Scientific paper

10.1016/j.jnoncrysol.2006.09.043

The kinetics of E' centers (silicon dangling bonds) induced by 4.7eV pulsed laser irradiation in dry fused silica was investigated by in situ optical absorption spectroscopy. The stability of the defects, conditioned by reaction with mobile hydrogen of radiolytic origin, is discussed and compared to results of similar experiments performed on wet fused silica. A portion of E' and hydrogen are most likely generated by laser-induced breaking of Si-H precursors, while an additional fraction of the paramagnetic centers arise from another formation mechanism. Both typologies of E' participate to the reaction with H_2 leading to the post-irradiation decay of the defects. This annealing process is slowed down on decreasing temperature and is frozen at T=200K, consistently with the diffusion properties of H_2 in silica.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Stability of E' centers induced by 4.7eV laser radiation in SiO2 does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Stability of E' centers induced by 4.7eV laser radiation in SiO2, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Stability of E' centers induced by 4.7eV laser radiation in SiO2 will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-284426

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.