Randomized benchmarking and process tomography for gate errors in a solid-state qubit

Details Randomized benchmarking and process tomography for gate errors in a solid-state qubit Randomized benchmarking and process tomography for gate errors in a solid-state qubit

2008-11-26

arxiv.org/abs/0811.4387v1

Phys. Rev. Lett. 102, 090502 (2009)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

4 pages, 4 figures, plus supplementary material

Scientific paper

10.1103/PhysRevLett.102.090502

We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double pi pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1+/-0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.

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