Modeling single- and multiple-electron resonances for electric-field-sensitive scanning probes

Details Modeling single- and multiple-electron resonances for electric-field-sensitive scanning probes Modeling single- and multiple-electron resonances for electric-field-sensitive scanning probes

2008-06-11

arxiv.org/abs/0806.1899v1

Nanotechnology 19 (2008) 445503.

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

10 pages, 4 figures

Scientific paper

10.1088/0957-4484/19/44/445503

We have developed a modeling method suitable to analyze single- and
multiple-electron resonances detected by electric-field-sensitive scanning
probe techniques. The method is based on basic electrostatics and a numerical
boundary-element approach. The results compare well to approximate analytical
expressions and experimental data.

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