Swift Heavy Ion Induced Modification Studies of C60 Thin Films

Details Swift Heavy Ion Induced Modification Studies of C60 Thin Films Swift Heavy Ion Induced Modification Studies of C60 Thin Films

2002-07-25

arxiv.org/abs/cond-mat/0207602v1

Physics

Condensed Matter

Materials Science

7 pages, 29 references and 9 figures submitted to J. Appl. Phys

Scientific paper

10.1063/1.1581381

Modification induced by 110 MeV Ni ion irradiated thin film samples of C60 on Si and quartz substrates were studied at various fluences. The pristine and irradiated samples were investigated using Raman spectroscopy, electrical conductivity and optical absorption spectroscopy. The Raman data and band gap measurements indicate that swift ions at low fluences result in formations that involve multiple molecular units like dimer or polymer. High fluence irradiation resulted in sub-molecular formations and amorphous semiconducting carbon, indicating overall damage of the fullerene molecules. These sub-molecular units have been identified with nanocrystalline diamond and nanocrystalline graphite like formations.

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